JST International : International Journal of Undergraduate Academic Research and Scholarly Excellence on Science & Technology

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JST International

JST International is a scholarly peer review open access journal solely dedicated to the undergraduate students to showcase their innovative ideas and research output. The journal was created in order to embrace the notion of academia as a community, with students playing a strong and active role in that community, and aims to support undergraduate students in their first foray into academic publishing.

JST International is a peer-reviewed journal, dedicated to the publication of high-quality undergraduate student research. The opportunities for participating in undergraduate research are unfortunately quite limited in India due to lack of emphasis in this particular aspect of a student’s education. JST International invites innovative articles and abridged form of student’s final year project to be reported in this journal. Undergraduate Students from all branches of engineering, science and technology are welcome to contribute their research findings and innovative projects to this journal.

JST International is an open access, which means that your manuscript is available to anyone in the world to download / read for free directly from the website. All manuscripts submitted in JST are pre-reviewed by the editor, and if appropriate, sent for blind peer review. Contributions must be original, not previously or simultaneously published elsewhere, and are critically reviewed before they are published. Papers, which must be written in English, should have sound grammar and proper terminologies.

The journal welcomes academic articles from all disciplinary areas and all universities. JST International is published bi-annually and publishes papers written by undergraduate students or papers written collaboratively by undergraduate students and academics.

Focus & Scope:

The International Journal of Undergraduate Academic Research and Scholarly Excellence on Science & Technology cover all the key issues in the domain including:

  • Ad hoc & sensor networks
  • Adaptive applications
  • Aeronautical Engineering
  • Aerospace Engineering
  • Agricultural Engineering
  • AI and Image Recognition
  • Allied engineering materials
  • Applied mechanics
  • Architecture & Planning
  • Artificial intelligence
  • Audio Engineering
  • Automation and Mobile Robots
  • Automotive Engineering
  • Bioengineering
  • Bioinformatics
  • Biomedical Engineering
  • Broadband Communications
  • Chemical Engineering
  • Civil Engineering
  • Computational engineering
  • Computational Intelligence
  • Computer Networks
  • Computer Science Engineering
  • Computer Software / Hardware
  • Control and Computer Systems
  • Data Compression
  • Data Engineering
  • Design engineering
  • Digital Speech Processing
  • Electrical Engineering
  • Electromechanical System Engineering
  • Electronics Engineering
  • Embedded Systems & Applications
  • Fault Tolerance
  • Geological Engineering
  • Industrial Engineering
  • Information Technology
  • Intelligent Systems
  • Manufacturing Engineering
  • Materials Engineering
  • Mechanical Engineering
  • Mechatronics
  • Microstrip circuits and components
  • Microwaves, Antennas, Propagation
  • Mobile Computing
  • Modeling and Simulation
  • Nuclear Engineering
  • Optical Networking technologies
  • Optical networks
  • Parallel Computing Systems
  • Pattern Recognition
  • Power Engineering
  • Radar, Optical Communications
  • Remote sensing
  • Robotics and Intelligent Sensing
  • Routing, Scheduling and Switching technologies
  • Satellite Communications
  • Scattering, RF-IC, systems-on-chips
  • Sensors and measuring techniques
  • Signal Processing & applications
  • Signal Processing for Communications
  • Software Engineering
  • System Engineering
  • System safety and Security
  • Telecommunication Engineering
  • Wireless & Mobile Multimedia Network Management
  • Wireless communications

 

 

Sample Author Certificate

 

Important Notic

Attention to Authors

Call for Paper For coming issue of "JST International"